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Item hits: (21)
Issue YearTitleAuthor(s)TypeViewsDownloads
2019The Concentration Measurements of Tellurium Donor Impurity in Lamellar Bismuth Samples by the Time-of-Flight Mass Spectrometry MethodMatveev, D.Yu.; Starov, D.V.Article52
2019Electrical Properties of the Сu2O/Cd1 – xZnxTe HeterostructureMaistruk, E.V.; Koziarskyi, I.P.; Koziarskyi, D.P.; Maryanchuk, P.D.Article63
2019Effect of the Annealing Gas and RF Power Sputtering in the Electrical, Structural and Optical Properties of ITO Thin FilmsBoussoum, O.; Belkaid, M.S.; Renard, C.; Halais, G.; Farhati, F.Article135
2019Surface-barrier Structures Au/n-CdS: Fabrication and Electrophysical PropertiesPetrus, R.; Ilchuk, H.; Kashuba, A.; Semkiv, I.; Zmiiovska, E.; Honchar, F.; Lys, R.Article31
2019Structure and Phase Formation Features of Ti-Zr-Ni Quasicrystalline Films under HeatingMalykhin, S.V.; Kondratenko, V.V.; Kopylets, I.А.; Surovitskiy, S.V.; Baturin, А.А.; Mikhailov, I.F.; Reshetnyak, M.V.; Borisova, S.S.; Bogdanov, Yu.S.Article33
2018Электрические свойства тонких плѐнок Cu2ZnSnSe4 и Cu2ZnSnSe2Te2(S2), полученных методом термовакуумного напыленияКозярский, И.П.; Майструк, Э.В.; Козярский, Д.П.; Марьянчук, П.Д.Article2511
2018Идентификация плазмонно-резонансных характеристик тонких металлических пленокБарабаш, М.Ю.Article1710
2018Structure Features of Bismuth Films Doped with TelluriumMatveev, D.Yu.; Starov, D.V.; Demidov, E.V.Article45
2018Effect of Annealing Temperature on Structural, Optical and Electrical Properties of ZnO Thin Films Prepared by Sol-Gel MethodBenramache, S.; Aoun, Y.; Lakel, S.; Mourghade, H.; Gacem, R.; Benhaoua, B.Article1211
2018Influence of Annealing on the Structure of Ultrathin Gold Films on the Surface of Glass and CdS SubstratesDanylov, A.B.; Ilchuk, H.A.; Petrus, R.Yu.; Haiduchok, V.G.Article11
2018Структурні та електричні властивості тонких плівок AgSbSe2 з включеннями халькогенідів свинцюТур, Ю.В.; Вірт, І.С.Article11
2018Optical Characterization of Thin Films Poly (Ethylene Oxide) Doped with Cesium IodideMohammed, Al-Tweissi; Mou'ad, A.Tarawneh; Owaidat, M.Q.; Monther, AlsboulArticle45
2018Дослідження мікромеханічних властивостей тонких плівок PbTe та PbSeТур, Ю.В.; Вірт, І.С.Article13
2018Optimizing Combination of Parameters for Pull-off Adhesion Testing through Design of Experiment StudyUllah, S.; Weilguny, R.; Kurt, S.; Zieger, G.Article22
2017Effect of Sprayed Solution Volume on Structural and Optical Properties of Nickel Oxide Thin FilmsBenhamida, S.; Benhaoua, B.; Barir, R.; Rahal, A.; Benhaoua, A.Article1931
2016Carrier Scattering Mechanisms in Bismuth Films Doped with TelluriumMatveev, D.Yu.Article2429
2016Crystalline Structure, Electrophysical and Magnetoresistive Properties of High Entropy Film AlloysVorobiov, Serhii Ihorovych; Kondrakhova, Daria Mykolaivna; Shumakova, Nataliia Ivanivna; Protsenko, Ivan Yukhymovych; Непийко, С.О.; Подуремне, Д.В.Article4861
2016Femtosecond Laser Crystallization of Boron-doped Amorphous Hydrogenated Silicon FilmsRybalko, P.D.; Khenkin, M.V.; Forsh, P.A.; Drevinskas, R.; Matsukatova, A.N.; Kazansky, P.; Kazanskii, A.G.Article2032
2011Structure, Optical And Electrical Characterization Of Tin Selenide Thin Films Deposited At Room Temperature Using Thermal Evaporation MethodKumar, N.; Sharma, V.; Parihar, U.; Sachdeva, R.; Padha, N.; Panchal, C.J.Article269282
2011The optimization of optical thin films deposition using in-situ reflectivity measurements and simulationBhatt, G.G.; Kheraj, V.; Desai, M.S.; Panchal, C.J.Article191155