Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/35321
Or use following links to share this resource in social networks: Recommend this item
Title Effect of Film Thickness and Annealing on the Structural and Optical Properties of CuInAlSe2 Thin Films
Authors Parihar, U.
Padha, N.
Ray, J.R.
Desai, M.S.
Panchal, C.J.
Mehta, P.K.
Cheshko, Iryna Volodymyrivna  
Protsenko, Ivan Yukhymovych  
ORCID http://orcid.org/0000-0002-1585-6712
http://orcid.org/0000-0003-3351-9303
Keywords Film system
CuInAlSe2
Optical properties
Scanning electron microscopy
Hall Effect
Type Conference Papers
Date of Issue 2013
URI http://essuir.sumdu.edu.ua/handle/123456789/35321
Publisher Sumy State University
License
Citation Effect of Film Thickness and Annealing on the Structural and Optical Properties of CuInAlSe2 Thin Films of CuInAlSe2 Thin Films [Текст] / U. Parihar, N. Padha, J.R. Ray et al. // Nanomaterials: Applications & Properties (NAP-2013) : 2-nd International conference, Alushta, the Crimea, September 17-22, 2012 / Edited by: A. Pogrebnjak. - Sumy : Sumy State University, 2013. - V.2, No1. - 01PCSI29
Abstract CuIn1 – xAlxSe2 (CIAS) thin films were grown using flash evaporation method by varying the film thickness from 500 nm to 700 nm. Prepared CIAS thin films were annealed at 573 K for one hour in vacuum. The influence of film’s thickness and the annealing temperature were characterized by the X-ray diffraction (XRD), Scanning electron microscopy (SEM), Energy dispersive analysis of X-ray (EDAX), Optical transmission measurements, and Hall Effect measurement. As the film thickness increases the crystallinity improves and due to that the optical absorption also improves. The further improvement for different thicknesses of CIAS thin films were observed by annealing. The thicker (700 nm) and annealed CIAS thin film shows the crystallite size of 24.3 nm, energy band gap of 1.19 eV, and resistivity of about 9  102 Ω cm. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35321
Appears in Collections: Наукові видання (ЕлІТ)

Views

Algeria Algeria
1
China China
1256612255
Denmark Denmark
2
France France
156561
Germany Germany
8033
Greece Greece
1
India India
43238615
Iraq Iraq
3
Ireland Ireland
3655383
Lithuania Lithuania
1
Mexico Mexico
1
Netherlands Netherlands
20078
Pakistan Pakistan
1
Russia Russia
4
Senegal Senegal
1
Singapore Singapore
1
Spain Spain
1
Sweden Sweden
1
Tunisia Tunisia
1
Turkey Turkey
2
Ukraine Ukraine
418872029
United Kingdom United Kingdom
185738261
United States United States
905748643
Unknown Country Unknown Country
418872028
Vietnam Vietnam
312978

Downloads

Algeria Algeria
1
China China
1256612256
EU EU
1
France France
1
Germany Germany
2
India India
11572029
Lithuania Lithuania
1
Pakistan Pakistan
1
Senegal Senegal
1
Ukraine Ukraine
1256612253
United Kingdom United Kingdom
104374
United States United States
-1421737602
Unknown Country Unknown Country
68
Vietnam Vietnam
1

Files

File Size Format Downloads
princon_2013_2_1_72.pdf 1,46 MB Adobe PDF 1103163387

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.