Showing results 1 to 1 of 1
| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2022 | Improvement Analysis of Leakage Currents with Stacked High-k/Metal Gate in 10 nm Strained Channel HOI FinFET | Payal, K.; Swagat, N.; Priyanka, S.; Rudra, S.D. | Article | 1924646622 | -366501546 |