Showing results 1 to 2 of 2
| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2014 | Multiangular and Spectral Ellipsometry for Semiconductor Nanostructures Classification | Goloborodko, A.A.; Epov, M.V; Robur, L.Y; Rodionova, T.V. | Article | 504421998 | -754862531 |
| 2021 | Topological Analysis of the Effect of Annealing on the Grain-Boundary Structure of Polysilicon Films | Rodionova, T.V.; Lytvyn, P.M.; Len, Yu.A.; Kulyk, S.P. | Article | 291181509 | 410763629 |