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| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2011 | Investigation of implantation-induced damage in indium phosphide for layer transfer applications | Dadwal, U.; Pareek, V.; Scholz, R.; Reiche, M.; Chandra, S.; Singh, R. | Article | 1479514481 | 956400408 |