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| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2021 | Topological Analysis of the Effect of Annealing on the Grain-Boundary Structure of Polysilicon Films | Rodionova, T.V.; Lytvyn, P.M.; Len, Yu.A.; Kulyk, S.P. | Article | 291181509 | 410763629 |