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| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2013 | Nano-structural, Electrical and Mechanical Characterization of Zirconium Oxide Thin Films as a Function of Annealing Temperature and Time | Khojier, K.; Sarshar, S.; Jafari, F.; Borzou, A. | Conference Papers | 64321459 | -446195562 |