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| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2020 | Angular Ellipsometry of Porous Silicon Surface Layers | Poperenko, L.V.; Rozouvan, S.G.; Yurgelevych, I.V.; Lishchuk, P.O. | Article | -793653020 | 1446180530 |