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Issue Year | Title | Author(s) | Type | Views | Downloads |
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2015 | Raman Spectroscopic Measurement of a Vacuum-Deposited C60 Thin Film | Konno, T.; Ren, L.; Piao, G.; Juárez García, J.M.; Suárez, F.M.; Jimenez-Sandoval, S.J.; Wakahara, T.; Miyazawa, K.; Ferreira, E.M. | Conference Papers | 450238887 | 234771691 |