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| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2014 | Evaluation of Vertical Coherence Length, Twist and Microstrain of GaAs / Si Epilayers Using Modified Williamson-Hall Analysis | Ravi Kumar, ; Tapas Ganguli, ; Vijay Chouhan, ; Dixit, V.K.; Puspen Mondal, ; Srivastava, A.K.; Mukherjee, C.; Sharma, T.K. | Article | 266590423 | 247064310 |