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| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2015 | Detection of Structural Characteristics of Nanosized SnxSy Film by the Modulation-polarization Spectroscopy of Plasmon Resonance | Vozny, A.A.; Stetsenko, Μ.Ο.; Rudenko, S.P.; Kosiak, Volodymyr Volodymyrovych; Maksimenko, L.S.; Opanasiuk, Anatolii Serhiiovych; Serdega, B.K. | Conference Papers | -2096132717 | 1420490870 |