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| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2016 | Investigating the Temperature Effects on ZnO, TiO2, WO3 and HfO2 Based Resistive Random Access Memory (RRAM) Devices | Dongale, T.D .; Khot, K.V.; Mohite, S.V.; Khandagale, S.S.; Shinde, S.S.; Patil, V.L.; Vanalkar, S.A.; Moholkar, A.V.; Rajpure, K.Y.; Bhosale, P.N.; Patil, P.S.; Gaikwad, P.K.; Kamat, R.K. | Article | -810098531 | 1543876218 |