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| Issue Year | Title | Author(s) | Type | Views | Downloads |
|---|---|---|---|---|---|
| 2021 | Calibration of X-ray Diffraction Measurements for Depth-selective Structural Analysis of Two-layer Samples | Danilchenko, S.N.; Kochenko, O.V.; Kalinkevich, A.N.; Stepanenko, Andrii Oleksandrovych; Zinchenko, Ye.I.; Danylchenko, P.S.; Protsenko, Ivan Yukhymovych | Article | -38368150 | -1937805770 |