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Title | Measurement technique straine deformation properties film materials at the elastic and plastic deformation |
Authors |
Velykodnyi, Dmytro Volodymyrovych
![]() Nadimzad, Sogol Shirzadfar, Hamidreza Odnodvorets, Larysa Valentynivna ![]() Protsenko, Ivan Yukhymovych ![]() |
ORCID |
http://orcid.org/0000-0003-0044-5619 http://orcid.org/0000-0002-8112-1933 http://orcid.org/0000-0003-3351-9303 |
Keywords |
plastic deformation LabVIEW elastic deformation thin films |
Type | Article |
Date of Issue | 2010 |
URI | http://essuir.sumdu.edu.ua/handle/123456789/1594 |
Publisher | |
License | |
Citation | |
Abstract |
Automated systems for for obtain film samples and research of srtain deformation properties of sensitive elements of sensors are presented.
When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/1594 |
Appears in Collections: |
Наукові видання (ЕлІТ) |
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Files
File | Size | Format | Downloads |
---|---|---|---|
Velykodnyi.doc | 292 kB | Microsoft Word | 1249542322 |
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