Investigation of the self-similar structure of the carbon thin films

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Title	Investigation of the self-similar structure of the carbon thin films
Authors	Borysiuk, Vadym Mykolaiovych
ORCID
Keywords	self-similarity самоподобие самоподібність carbon thin films углеродные тонкие пленки вуглецеві плівки
Type	Conference Papers
Date of Issue	2011
URI	http://essuir.sumdu.edu.ua/handle/123456789/20616
Publisher	Видавництво СумДУ
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Citation	Borisyuk, V.N. Investigation of the self-similar structure of the carbon thin films [Текст] / V.N. Borisyuk // Nanomaterials: applications & properties. Proceedings : 1-st International conference, Alushta, Crimea, 27-30 Semptember 2011 / Edited by: A. Pogrebnjak, T. Lyutyy, S. Protsenko. — Sumy : Sumy State University, 2011. — V.1, P.ІІ. — C. 317-319.
Abstract	Self-similar structure of the carbon thin films, obtained by magnetron sputtering is investigated numerically. Statistical parameters are calculated within two dimensional multifractal detrended fluctuation analysis. The numerical model for the surfaces under investigation was build from the SEM images of the carbon thin films. It is shown that the self-similarity in surface roughness preserves over all fragments of the sample, and through different resolutions of the SEM images. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/20616
Appears in Collections:	Наукові видання (ЕлІТ)