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Title | Fabrication of Low-Roughness Au/Ti/ SiO2/Si Substrates for Nanopatterning of 16-Mercapto Hexadecanoic Acid (MHA) by Dip-Pen-Nanolithography |
Authors |
Kumar, A.
Agarwal, P.B. Gupta, S.K. Sharma, A.K. Kumar, D. Chandra, Shekhar |
ORCID | |
Keywords |
Atomic force microscopy Dip-pen-nanolithography Nanopatterning Self-assembled-monolayers |
Type | Article |
Date of Issue | 2012 |
URI | http://essuir.sumdu.edu.ua/handle/123456789/27794 |
Publisher | Сумський державний університет |
License | Copyright not evaluated |
Citation | A. Kumar, P.B. Agarwal, S.K. Gupta, et al., J. Nano-Electron. Phys. 4 No 2, 22 (2012) |
Abstract |
Silicon based low-roughness Au/Ti/SiO2/Si substrates were fabricated using standard IC fabrication
processes. Evolution of surface roughness during substrate fabrication process was studied. Fabrication
process steps, namely, thermal oxidation and e-beam evaporation for ultra-thin Ti(~ 5 nm)/Au(22 nm)
films, were optimized to result in surface r.m.s roughness ~ 0.2 m and ~ 1.0 nm, after thermal oxidation
and Ti/Au deposition steps respectively. Surface roughness was estimated by atomic force microscope
(AFM) imaging and image analysis. Nano-patterning experiments using thiol based 16-MHA molecular-ink
on fabricated substrates were carried out, under controlled environment conditions, by dip-pen-nanolithography
(DPN) technique. Minimum line-width ~ 60 nm and circular dots radius ~ 175 nm were patterned.
When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/27794 |
Appears in Collections: |
Журнал нано- та електронної фізики (Journal of nano- and electronic physics) |
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