Please use this identifier to cite or link to this item:
http://essuir.sumdu.edu.ua/handle/123456789/27885
Or use following links to share this resource in social networks:
Tweet
Recommend this item
Title | Current transport behaviour of Au/n-GaAs Schottky diodes grown on Ge substrate with different epitaxial layer thickness over a wide temperature range |
Authors |
Padha, N.
Sachdeva, R. Sihotra, R. Krupanidhi, S.B. |
ORCID | |
Keywords |
ideality factor barrier height thermionic field emission tunneling inhomogenities junction breakdown richardson constant |
Type | Article |
Date of Issue | 2011 |
URI | http://essuir.sumdu.edu.ua/handle/123456789/27885 |
Publisher | Видавництво СумДУ |
License | Copyright not evaluated |
Citation | Current transport behaviour of Au/n-GaAs Schottky diodes grown on Ge substrate with different epitaxial layer thickness over a wide temperature range [Текст] / N. Padha, R. Sachdeva, R. Sihotra, S.B. Krupanidhi // Journal of Nano- and Electronic Physics. — 2011. — Vol. 3, № 1, Part V. — P. 926-936. |
Abstract |
The work presents temperature dependent forward and reverse current-voltage (I-V) analyses of n-GaAs/Au Schottky Diodes grown on n+ Ge substrate with different epitaxial layer thicknesses. While some of the Schottky diodes follow TED mechanism, others exceed significantly from this theory due to existence of patches of reduced barrier height embedded in the Schottky interface. The zero bias barrier heights (φbo) increase (0.649 to 0.809 eV) while the ideality factors (η) decrease (1.514 to 1.052) with increase in epitaxial layer thickness (1-4 μm), thus, indicating similar behaviour to that observed for the I-V characteristics of the undertaken Schottky diodes with decreasing temperature. It all indicated the existence of barrier inhomogenities over the M-S interface. The breakdown behaviour analysis of these diodes showed some interesting results; the breakdown voltage (VBR) decreases with temperature and shows ‘Defect Assisted Tunneling’ phenomenon through surface or defect states in the 1 μm thick epitaxial layer Schottky diode while VBR increases with temperature in 3 μm and 4 μm thick epitaxial layer Schottky diodes which demonstrate ‘Avalanche Multiplication’ mechanism responsible for junction breakdown. The reverse breakdown voltage is also seen to increase (2.7-5.9 Volts) with the increase in epitaxial layer thickness of the diodes. The undertaken diodes have been observed to follow TFE mechanism at low temperatures (below 200 K) in which the tunneling current component increases with epitaxial layer thickness which has been ascribed as an impact of GaAs/Ge hetero-interface over the Au/n-GaAs Schottky barrier.
When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/27885 |
Appears in Collections: |
Журнал нано- та електронної фізики (Journal of nano- and electronic physics) |
Views

1

1

1

1970053693

1

2

-140288868

1

1

1211428

1

1

1

1

1

1

5297238

3

1

12

1

2

6

84496821

1

38914245

1904046730

84496820

154184
Downloads

21

1

-140288872

1

1

1

1

1

1

2

1

1

1

1

253485295

1

-140288871

-346584964

1
Files
File | Size | Format | Downloads |
---|---|---|---|
Padha.pdf | 405.44 kB | Adobe PDF | -373677376 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.