Structural and optical-properties of CdTe and CdMnTe films

Opanasiuk, Anatolii Serhiiovych; Koval, Pavlo Viktorovych; Коваль, Павел Викторович; Kosiak, Volodymyr Volodymyrovych; Fochuk, P.M.; Bolotnikov, A.E.; James, R.B.

Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/30130

Or use following links to share this resource in social networks: Recommend this item

Title	Structural and optical-properties of CdTe and CdMnTe films
Authors	Opanasiuk, Anatolii Serhiiovych Koval, Pavlo Viktorovych Коваль, Павел Викторович Kosiak, Volodymyr Volodymyrovych Fochuk, P.M. Bolotnikov, A.E. James, R.B.
ORCID	http://orcid.org/0000-0002-1888-3935
Keywords	CdTe Cd1-xMnxTe structural analyses scattering domains wide band-gap semiconductors transmission- and reflection-spectra
Type	Conference Papers
Date of Issue	2012
URI	http://essuir.sumdu.edu.ua/handle/123456789/30130
Publisher	Brookhaven National Laboratory
License	Copyright not evaluated
Citation	Structural and optical-properties of CdTe and CdMnTe films / A.S. Opanasyuk, P.V. Koval, V.V. Kosyak [et al.] [Текст] // Мaтеріaли міжнaродної конференції 2012-SPIE Optics & Photonics Conference. – San-Diego, USA, 2012.
Abstract	We undertook a detailed investigation of the structural- and optical-properties of CdTe- and Cd1-xMnxTe-semiconductor films deposited by close-spaced vacuum sublimation using thermal evaporation on non-oriented substrates. From our structural- and phase-analysis of the layers, we obtained information on their structure, deformations, grain size, and content of dislocations for films deposited at different substrate temperatures. We considered that despite the presence of defects in the crystals, the films offer promise for fabrication into x-ray detectors. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/30130
Appears in Collections:	Наукові видання (ЕлІТ)