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Title | Diode Based on Amorphous SiC |
Authors |
Zakhvalinskii, V.S.
Borisenko, L.V. Aleynikov, A.J. Piljuk, E.A. Goncharov, I. Taran, S.V. |
ORCID | |
Keywords |
Atomic force microscopy Transmission electron microscope Silicon carbide Thin films |
Type | Article |
Date of Issue | 2013 |
URI | http://essuir.sumdu.edu.ua/handle/123456789/33656 |
Publisher | Сумський державний університет |
License | |
Citation | V.S. Zakhvalinskii, L.V. Borisenko, A.J. Aleynikov, et al., J. Nano- Electron. Phys. 5 No 4, 04029 (2013) |
Abstract |
Diode structure on the basis of amorphous silicon carbide and p-type polycrystalline silicon (Eurosolar) were obtained with magnetron RF-nonreactive sputtering method from solid-phase target in argon atmosphere.
When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33656 |
Appears in Collections: |
Журнал нано- та електронної фізики (Journal of nano- and electronic physics) |
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Zakhvalinskii_Silicon carbide.pdf | 197.4 kB | Adobe PDF | 155280470 |
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