Raman analysis of Zn1-xMnxTe polycrystalline films

Klymov, Oleksii Volodymyrovych; Kurbatov, Denys Ihorovych; Opanasiuk, Anatolii Serhiiovych; Kosiak, Volodymyr Volodymyrovych; Копач, В.; Копач, В.; Kopach, V.; Болотников, А.Е.; Болотников, А.Е.; Bolotnikov, А.Е.; Джеймс, Р.Б.; Джеймс, Р.Б.; James, R.B.; Фочук, П.М.; Фочук, П.М.; Fochuk, P.M.

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Title	Raman analysis of Zn1-xMnxTe polycrystalline films
Authors	Klymov, Oleksii Volodymyrovych Kurbatov, Denys Ihorovych Opanasiuk, Anatolii Serhiiovych Kosiak, Volodymyr Volodymyrovych Копач, В. Копач, В. Kopach, V. Болотников, А.Е. Болотников, А.Е. Bolotnikov, А.Е. Джеймс, Р.Б. Джеймс, Р.Б. James, R.B. Фочук, П.М. Фочук, П.М. Fochuk, P.M.
ORCID	http://orcid.org/0000-0002-2754-6367 http://orcid.org/0000-0002-1888-3935
Keywords	Raman spectroscopy surface morphology x-ray diffraction lattice parameters solid solution of Zn1-xMnxTe closed space vacuum sublimation
Type	Article
Date of Issue	2013
URI	http://essuir.sumdu.edu.ua/handle/123456789/33848
Publisher	SPIE
License
Citation	Raman analysis of Zn1-xMnxTe polycrystalline films [Text] / О. V. Klimov , D. I. Kurbatov , A. S. Opanasyuk , V. V. Kosyak , V. Kopach , P. M. Fochuk , A. E. Bolotnikov, R. B. James // Proc. of SPIE. – 2013. – P. 88521G-1-88521G-5.
Abstract	In this paper, we have investigated some structural properties, Raman spectra of Zn1-xMnxTe films deposited by the closed space vacuum sublimation under different growth conditions. The obtained results of the Raman spectroscopy and XRD analysis show single phase composition of the samples. The presence of phonon replicas in the Raman spectra of the films indicates their high structural quality. The manganese content (about 7 %) in the layers was determined according to shifting the relative peaks positions. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33848
Appears in Collections:	Наукові видання (ЕлІТ)