Effect of Cu negative ion implantation on physical properties of Zn1-xMnxTe films

Pohrebniak, Oleksandr Dmytrovych; Opanasiuk, Anatolii Serhiiovych; Kurbatov, Denys Ihorovych; Kolotova, I.A.; Amekura, H.; Klymov, Oleksii Volodymyrovych; Takeda, Y.; Kozak, C.; Shypylenko, Andrii Pavlovych

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Title	Effect of Cu negative ion implantation on physical properties of Zn1-xMnxTe films
Authors	Pohrebniak, Oleksandr Dmytrovych Opanasiuk, Anatolii Serhiiovych Kurbatov, Denys Ihorovych Kolotova, I.A. Amekura, H. Klymov, Oleksii Volodymyrovych Takeda, Y. Kozak, C. Shypylenko, Andrii Pavlovych
ORCID	http://orcid.org/0000-0002-9218-6492 http://orcid.org/0000-0002-1888-3935 http://orcid.org/0000-0002-2754-6367 http://orcid.org/0000-0002-1741-2525
Keywords	Ion Implantation Zn1-xMnxTe Films surface morphology phase analysis elemental analysis
Type	Article
Date of Issue	2013
URI	http://essuir.sumdu.edu.ua/handle/123456789/33849
Publisher	Acta physica polonica A
License	Copyright not evaluated
Citation	Effect of Cu negative ion implantation on physical properties of Zn1-xMnxTe films [Text] / A.D. Pogrebnjak, A.P. Shypylenko, H. Amekura, Y. Takeda, A.S. Opanasyuk, D.I. Kurbatov, I.A. Kolotova, O.V. Klymov, C. Kozak // Acta Physica Polonica A. –2013. – Vol. 123;№ 5. - P. 939-942.
Abstract	The paper deals with the investigations of structural properties of Zn1-xMnxTe lms, which were fabricated under various deposition conditions using the thermal evaporation method in a closed volume. The surface mor- phology of the samples was studied, the phase analysis of their structures was performed, the elemental analysis of the lms and the crystal lattice constant were investigated. The texture perfection of the lms before and after copper ion implantation was evaluated. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33849
Appears in Collections:	Наукові видання (ЕлІТ)