Raman and Photoluminescence Investigation of Films of Solid Solutions Zn1-xMnxTe

Kurbatov, Denys Ihorovych; Klymov, Oleksii Volodymyrovych; Opanasiuk, Anatolii Serhiiovych; Kosiak, Volodymyr Volodymyrovych; Nam, D.; Nam, D.; Nam, D.; Cheong, H.; Cheong, H.; Cheong, H.

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Title	Raman and Photoluminescence Investigation of Films of Solid Solutions Zn1-xMnxTe
Authors	Kurbatov, Denys Ihorovych Klymov, Oleksii Volodymyrovych Opanasiuk, Anatolii Serhiiovych Kosiak, Volodymyr Volodymyrovych Nam, D. Nam, D. Nam, D. Cheong, H. Cheong, H. Cheong, H.
ORCID	http://orcid.org/0000-0002-2754-6367 http://orcid.org/0000-0002-1888-3935
Keywords	Diffraction Patterns Photoluminescence Raman Spectrometry
Type	Conference Papers
Date of Issue	2013
URI	http://essuir.sumdu.edu.ua/handle/123456789/33900
Publisher	Sumy State University Publishing
License	Copyright not evaluated
Citation	Raman and Photoluminescence Investigation of Films of Solid Solutions Zn(1-x)Mn(x)Te [Текст] / D.I. Kurbatov1, O.V. Klymov, A.S. Opanasyuk, V.V. Kosyak, D. Nam, H. Cheong // 3rd International Conference “Nanomaterials: Applications & Properties - 2013 (NAP-2013)”. – Alushta, the Crimea, Ukraine, 2013. — С. 01NTF39-1.
Abstract	In this paper, we have investigated some structural properties, Raman spectra and photoluminescence spectra of Zn1-xMnxTe films deposited by the closed space vacuum sublimation under different growth conditions. The obtained results of the Raman spectroscopy and XRD analysis show single phase composition of the samples. The presence of phonon replicas in the Raman spectra of the films indicates their high structural quality. The manganese content (about 7 %) in the layers was determined according to shifting the relative peaks positions. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33900
Appears in Collections:	Наукові видання (ЕлІТ)