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Title | Absorption Cross Section and Photoluminescence Lifetime of Silicon-Based Light-Emitting nc-Si-SiOx Structures |
Authors |
Danko, V.A.
Shepeliavyi, P.E. Michailovska, K.V. Indutnyi, I.Z. |
ORCID | |
Keywords |
Si nanocrystals Photoluminescence Decay time |
Type | Conference Papers |
Date of Issue | 2012 |
URI | http://essuir.sumdu.edu.ua/handle/123456789/35011 |
Publisher | Sumy State University |
License | Copyright not evaluated |
Citation | Absorption Cross Section and Photoluminescence Lifetime of Silicon-Based Light-Emitting nc-Si-SiOx Structures / V. A. Dan'ko, P. E. Shepeliavyi, K. V. Michailovska, I. Z. Indutnyi // Nanomaterials: Applications & Properties (NAP-2012) : 2-nd International conference, Alushta, the Crimea, September 17-22, 2012 / Edited by: A. Pogrebnjak. - Sumy : Sumy State University, 2012. - V. 1, No3. - 03TF13 |
Abstract |
The spectral dependence of the photoluminescence (PL) decay kinetics at room temperature have been
studied in porous nc-Si-SiOx nanostructures. Investigated samples were obtained by oblique evaporation of
SiO with following annealing at 975 C in vacuum and treating in the HF vapor at 50 C. PL decay in these
structures described by a stretched exponential and the average lifetime of the PL decrease exponentially
with increasing energy of photons. PL lifetime values is in microsecond range that point out on phonon
participation in radiative recombination. Dispersion parameter do not depend on emission energy and
tends to 1 with increasing porosity, which is consistent with the model of noninteracting nc-Si. It was established,
that the absorption cross section σ of the nc-Si particles increase with decreasing of nc-Si dimensions
and increasing of emission energy.
This result is consistent with the quantum confinement effects, where the smaller nc-Si with larger
energy gaps are characterized by a short radiative lifetime and the corresponding radiative recombination
process take place within the individual nc-Si.
When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35011 |
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