Synthesis and Characterization of ZnSe1-xTex Alloy Thin Films Deposited by Electron Beam Technique

Abstract

ZnSe1-x Tex solid solutions were prepared and films were deposited on glass substrates with x 0.2, 0.4, 0.6 and 0.8. DTA/TGA analysis was carried out to study the alloy formation temperature. Structural studies by XRD results showed the polycrystalline nature of the films. The Full Width at Half Maximum (FWHM) values were observed from the XRD pattern and used to evaluate the microstructural parameters like crystallite size, strain, dislocation density and stacking fault density for all the films with x 0.2, 0.4, 0.6 and 0.8. These films were coated with a thickness of about 200 nm on glass substrates keeping the temperature constant at 200 C. All films showed cubic structure and the lattice parameter values are found to vary with „X‟. This confirms the solid solution formation between the ZnSe and ZnTe binary compounds which are found to obey Vegard‟s law. SEM and AFM studies have been arried out to observe their surface modification with solid solution formation. Raman studies confirm the formation of ZnSe1-xTex compound films. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35012