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Title | Substructural Features of Zn1-xMnxTe Solid Solution Thin Films |
Authors |
Kurbatov, Denys Ihorovych
![]() Klymov, Oleksii Volodymyrovych Opanasiuk, Anatolii Serhiiovych ![]() Danilchenko, S.M. Khlyap, H.M. |
ORCID |
http://orcid.org/0000-0002-2754-6367 http://orcid.org/0000-0002-1888-3935 |
Keywords |
Substructure X-ray diffraction patterns Microdeformations Orientation factor |
Type | Conference Papers |
Date of Issue | 2012 |
URI | http://essuir.sumdu.edu.ua/handle/123456789/35057 |
Publisher | Sumy State University |
License | |
Citation | Substructural Features of Zn1-xMnxTe Solid Solution Thin Films / O. V. Klymov, D. I. Kurbatov, A. S. Opanasyuk et al. // Nanomaterials: Applications & Properties (NAP-2012) : 2-nd International conference, Alushta, the Crimea, September 17-22, 2012 / Edited by: A. Pogrebnjak. - Sumy : Sumy State University, 2012. - V. 1, No3. - 03TF23 |
Abstract |
The substructural characteristics of Zn1-xMnxTe films deposited by closed space vacuum sublimation
method under various condensation conditions are investigated. Sizes of the coherent scattering domain
size, microdeformation degree, staking fault defects’ concentration in the condensates, the averaged dislocation
density at the subgrain boundaries and in their bulk as well as the total dislocation concentration
are determined by the physical broadening of the X-ray lines using the Cauchy and gauss approximations
and the threefold function convolution method. The calculations are compared with data for undoped ZnTe.
It is found out that the Mn-doping causes some degradation of structural characteristics of the condensates
compared with undoped layers.
When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35057 |
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