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Title | Enhanced Luminescence of InGaN / GaN Vertical Light Emitting Diodes with an InGaN Protection Layer |
Authors |
Lam, N.D.
Kim, S. Lee, J.J. Choi, K.R. Doan, M.H. Lim, H. |
ORCID | |
Keywords |
GaN InGaN LEDs Laser lift-off Recombination enhanced defect reaction |
Type | Conference Papers |
Date of Issue | 2013 |
URI | http://essuir.sumdu.edu.ua/handle/123456789/35210 |
Publisher | Sumy State University |
License | |
Citation | Enhanced Luminescence of InGaN / GaN Vertical Light Emitting Diodes [Текст] / N.D. Lam, S. Kim, J.J. Lee et al. // Nanomaterials: Applications & Properties (NAP-2013) : 2-nd International conference, Alushta, the Crimea, September 17-22, 2012 / Edited by: A. Pogrebnjak. - Sumy : Sumy State University, 2013. - V.2, No1. - 01NTF29 |
Abstract |
We have investigated the effectiveness of a thin n-In0.2Ga0.8N layer inserted in the bottom n-GaN layer
of InGaN/GaN blue light emitting diodes (LEDs) for the protection of multiple quantum wells during the
laser lift-off process for vertical LED fabrication. The photoluminescence properties of the InGaN/GaN
lateral LEDs are nearly identical irrespective of the existence of the n-In0.2Ga0.8N insertion layer in the
bottom n-GaN layer. However, such an insertion is found to effectively increase the photoluminescence
intensity of the multiple quantum well and the carrier lifetime of the vertical LEDs. These improvements
are attributed to the reduced defect generations in the vertical LEDs during the laser lift-off process due to
the presence of the protection layer.
When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35210 |
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