Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/36130
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Title On the Applicability of HF and μ-PCD Methods for Determination of Carrier Recombination Lifetime in the Non-passivated Single-crystal Silicon Samples
Authors Anfimov, I.M.
Kobeleva, S.P.
Schemerov, I.V.
Orlova, M.N.
ORCID
Keywords Single-crystal silicon
Contactless μ-PCD method
Carrier recombination lifetime
Photocon-ductivity decay
Type Article
Date of Issue 2014
URI http://essuir.sumdu.edu.ua/handle/123456789/36130
Publisher Sumy State University
License
Citation I.М. Anfimov, S.P. Kobeleva, I.V. Schemerov, M.N. Orlova, J. Nano- Electron. Phys. 6 No 3, 03018 (2014)
Abstract Comparison of the results of measuring the carrier recombination lifetime in silicon single crystals by contactless HF and microwave μ-PCD methods was carried out. It has been shown that HF method gives a large error compared with a μ-PCD method. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/36130
Appears in Collections: Журнал нано- та електронної фізики (Journal of nano- and electronic physics)

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China China
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France France
2
Germany Germany
2
Ireland Ireland
125165
Japan Japan
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Lithuania Lithuania
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Russia Russia
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Taiwan Taiwan
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Ukraine Ukraine
9297276
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Unknown Country Unknown Country
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