Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy

Нам, Д.; Nam, Dahyun; Opanasiuk, Anatolii Serhiiovych; Koval, Pavlo Viktorovych; Коваль, Павел Викторович; Koval, Pavlo Victorovich; Ponomarov, Oleksandr Heorhiiovych; Джонг, А.Р.; Jeong, Ah Reum; Кім, Д.Й.; Ким, Д.Й.; Kim, Gee Yeong; Джо, В.; Jo, William; Чеонг, Г.; Cheong, Hyeonsik

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Title	Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy
Authors	Нам, Д. Nam, Dahyun Opanasiuk, Anatolii Serhiiovych Koval, Pavlo Viktorovych Коваль, Павел Викторович Koval, Pavlo Victorovich Ponomarov, Oleksandr Heorhiiovych Джонг, А.Р. Jeong, Ah Reum Кім, Д.Й. Ким, Д.Й. Kim, Gee Yeong Джо, В. Jo, William Чеонг, Г. Cheong, Hyeonsik
ORCID	http://orcid.org/0000-0002-1888-3935
Keywords	Copper–zinc–tin selenide Thin films X-ray diffraction Energy dispersive X-ray spectroscopy Raman spectroscopy Confocal microscopy Particle induced X-ray emission Photoluminescence
Type	Article
Date of Issue	2014
URI	http://essuir.sumdu.edu.ua/handle/123456789/37033
Publisher	ELSEVIER
License	Copyright not evaluated
Citation	Dahyun Nama et al. Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy / Dahyun Nama, A.S. Opanasyukb, P.V. Kovalb, A.G. Ponomarevb, Ah Reum Jeongc, Gee Yeong Kimc, William Joc, Hyeonsik Cheong //Thin Solid Films, Volume 562, 1 July 2014, P. 109–113.
Abstract	Compositional and structural studies of Cu2ZnSnSe4 (CZTSe) thin films were carried out by X-ray diffraction, energy dispersive X-ray spectroscopy (EDS), particle induced X-ray emission (PIXE), photoluminescence, and Raman spectroscopy. CZTSe thin films with different compositions were deposited on sodalime glass by coevaporation. The composition of the filmsmeasured by two differentmethods, EDS and PIXE, showed significant differences. Generally, the Zn/Sn ratio measured by EDS is larger than that measured by PIXE. Both the micro- PIXE and the micro-Raman imaging results indicated the compositional and structural inhomogeneity of the sample. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/37033
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