Effect of Substrate Temperature on the Structural Properties of CdxZn1-xTe Films Grown by Close-Spaced Sublimation Method

Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/37188

Or use following links to share this resource in social networks: Recommend this item

Title	Effect of Substrate Temperature on the Structural Properties of CdxZn1-xTe Films Grown by Close-Spaced Sublimation Method
Authors	Znamenshchykov, Y.V. Kosyak, V.V. Opanasiuk, Anatolii Serhiiovych Stanislavov, A. Kuznetsov, V. Gnatenko, Yu.P.
ORCID	http://orcid.org/0000-0002-1888-3935
Keywords	CdZnTe Closed space sublimation XRD Bandgap Film
Type	Article
Date of Issue	2014
URI	http://essuir.sumdu.edu.ua/handle/123456789/37188
Publisher	Sumy State University
License	Copyright not evaluated
Citation	Proc. NAP 3, 01NTF24 (2014)
Abstract	In this work by energy dispersive analysis of X-rays, scanning electron microscopy and X-ray diffraction methods films of CdxZn1-xTe solid solution, obtained by a close-spaced vacuum sublimation technique under different temperatures of glass substrate, has been studied. Films were deposited by the co sublimation of Cadmium Telluride (CdTe) and Zinc Telluride (ZnTe) chunks, mixed in the ratio of 2:1. The effect of substrate temperature on the surface morphology, elemental and phase composition, lattice parameter, scattering domain sizes has been studied. The results of these studies can be used for obtaining absorber layers of tandem solar cells, basic layers of X-ray and gamma detectors.
Appears in Collections:	Наукові видання (ЕлІТ)