Simulation of Radiation Effects in SiO2/Si Structures

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Title	Simulation of Radiation Effects in SiO2/Si Structures
Authors	Komarov, A.F. Zayats, G.M. Komarov, F.F. Miskiewicz, S.A. Michailov, V.V.
ORCID
Keywords	Integrated сircuits Radiation MIS Numerical іimulation
Type	Article
Date of Issue	2014
URI	http://essuir.sumdu.edu.ua/handle/123456789/37281
Publisher	Sumy State University
License	Copyright not evaluated
Citation	Proc. NAP 3, 01PISERE04 (2014)
Abstract	We describe space-time evolution of electric charge induced in dielectric layer of simulated metal-insulator-semiconductor structures due to irradiation with X-rays. The system of equations used as a basis of the simulation model is solved iteratively by efficient numerical method. The obtained simulation results correlate well with the respective data presented in other scientific publications.
Appears in Collections:	Наукові видання (ЕлІТ)