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Title Detection of Structural Characteristics of Nanosized SnxSy Film by the Modulation-polarization Spectroscopy of Plasmon Resonance
Authors Vozny, A.A.
Stetsenko, Μ.Ο.
Rudenko, S.P.
Kosiak, Volodymyr Volodymyrovych
Maksimenko, L.S.
Opanasiuk, Anatolii Serhiiovych  
Serdega, B.K.
ORCID http://orcid.org/0000-0002-1888-3935
Keywords Thin films
SnxSy
Co-evaporation
Surface morphology
X-ray diffraction
Surface plasmon
Modulation-polarization spectroscopy
Type Conference Papers
Date of Issue 2015
URI http://essuir.sumdu.edu.ua/handle/123456789/42581
Publisher Sumy State University
License
Citation Detection of Structural Characteristics of Nanosized SnxSy Film by the Modulation-polarization Spectroscopy of Plasmon Resonance [Текст] / A.A. Vozny, M.O. Stetsenko, S.P. Rudenko et al. // Nanomaterials: Applications & Properties (NAP-2015) : Proceedings of the International Conference. — Sumy : Sumy State University, 2015. — V.4, No2. — 02NAESP06.
Abstract The present work deals with the study of the structural properties of nanosized SnS2 films deposited by the close-spaced vacuum sublimation (CSVS) method. Surface morphology of the obtained films was determined by the scanning electron microscope (SEM-102Е). Structural investigations of the films were performed with the Raman spectroscopy. The analysis of chemical composition of the layers was carried out by the scanning electron microscope by energy dispersive X-ray (ЕDS) spectroscopy. The structure features of SnxSy films were investigated by the modulation-polarization spectroscopy (MPS) technique of surface plasmon resonance.
Appears in Collections: Наукові видання (ЕлІТ)

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China China
892943699
France France
1
Germany Germany
914632
Hong Kong SAR China Hong Kong SAR China
1
India India
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Iran Iran
5
Ireland Ireland
1
Japan Japan
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South Korea South Korea
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Spain Spain
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Ukraine Ukraine
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United Kingdom United Kingdom
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-2096132716
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