Detection of Structural Characteristics of Nanosized SnxSy Film by the Modulation-polarization Spectroscopy of Plasmon Resonance

Vozny, A.A.; Stetsenko, Μ.Ο.; Rudenko, S.P.; Kosiak, Volodymyr Volodymyrovych; Maksimenko, L.S.; Opanasiuk, Anatolii Serhiiovych; Serdega, B.K.

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Title	Detection of Structural Characteristics of Nanosized SnxSy Film by the Modulation-polarization Spectroscopy of Plasmon Resonance
Authors	Vozny, A.A. Stetsenko, Μ.Ο. Rudenko, S.P. Kosiak, Volodymyr Volodymyrovych Maksimenko, L.S. Opanasiuk, Anatolii Serhiiovych Serdega, B.K.
ORCID	http://orcid.org/0000-0002-1888-3935
Keywords	Thin films SnxSy Co-evaporation Surface morphology X-ray diffraction Surface plasmon Modulation-polarization spectroscopy
Type	Conference Papers
Date of Issue	2015
URI	http://essuir.sumdu.edu.ua/handle/123456789/42581
Publisher	Sumy State University
License	Copyright not evaluated
Citation	Detection of Structural Characteristics of Nanosized SnxSy Film by the Modulation-polarization Spectroscopy of Plasmon Resonance [Текст] / A.A. Vozny, M.O. Stetsenko, S.P. Rudenko et al. // Nanomaterials: Applications & Properties (NAP-2015) : Proceedings of the International Conference. — Sumy : Sumy State University, 2015. — V.4, No2. — 02NAESP06.
Abstract	The present work deals with the study of the structural properties of nanosized SnS2 films deposited by the close-spaced vacuum sublimation (CSVS) method. Surface morphology of the obtained films was determined by the scanning electron microscope (SEM-102Е). Structural investigations of the films were performed with the Raman spectroscopy. The analysis of chemical composition of the layers was carried out by the scanning electron microscope by energy dispersive X-ray (ЕDS) spectroscopy. The structure features of SnxSy films were investigated by the modulation-polarization spectroscopy (MPS) technique of surface plasmon resonance.
Appears in Collections:	Наукові видання (ЕлІТ)