Simulation of Reciprocal Space Maps for Thin Ion-Implanted Layers in Yttrium-Iron Garnet Films with Defects

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Title	Simulation of Reciprocal Space Maps for Thin Ion-Implanted Layers in Yttrium-Iron Garnet Films with Defects
Authors	Olikhovskii, S.I. Skakunova, O.S. Molodkin, V.B. Len, E.G. Ostafiychuk, B.K. Pylypiv, V.M.
ORCID
Keywords	X-Ray Dynamical Diffraction Theory Yttrium Iron Garnet Ion Implantation Strain
Type	Conference Papers
Date of Issue	2015
URI	http://essuir.sumdu.edu.ua/handle/123456789/42642
Publisher	Sumy State University
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Citation	Simulation of Reciprocal Space Maps for Thin Ion-Implanted Layers in Yttrium-Iron Garnet Films with Defects [Текст] / S.I. Olikhovskii, O.S. Skakunova, V.B. Molodkin et al. // Nanomaterials: Applications & Properties (NAP-2015) : Proceedings of the International Conference. — Sumy : Sumy State University, 2015. — V.4, No1. — 01PCSI05.
Abstract	Numerical simulation of the reciprocal space maps measured from the ion-implanted single-crystal yttrium-iron garnet films on gadolinium-gallium garnet substrate has been carried out basing on the theoretical model of the triple-crystal dynamical diffractometry of crystalline multilayer systems with inhomogeneous strain distributions and randomly distributed defects. The presence of growth defects in both film and substrate as well as radiation defects created in subsurface layer of nanometer-scale thickness after 90 keV F+ ion implantation was taken into account in the proposed model of the film system.
Appears in Collections:	Наукові видання (ЕлІТ)