Grazing-incidence Small-angle X-ray Scattering Technique for Probing Nanostructures and Processes at Nanoscale

Jergel, M.; Šiffalovič, P.; Végsö, K.; Majková, E.; Roth, S.V.; Konovalov, O.; Lee, H.Y.

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Title	Grazing-incidence Small-angle X-ray Scattering Technique for Probing Nanostructures and Processes at Nanoscale
Authors	Jergel, M. Šiffalovič, P. Végsö, K. Majková, E. Roth, S.V. Konovalov, O. Lee, H.Y.
ORCID
Keywords	GISAXS X-rays Nanoparticle Self-assembly Langmuir-Blodgett Drop casting
Type	Conference Papers
Date of Issue	2015
URI	http://essuir.sumdu.edu.ua/handle/123456789/42696
Publisher	Sumy State University
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Citation	Grazing-incidence Small-angle X-ray Scattering Technique for Probing Nanostructures and Processes at Nanoscale [Текст] / M. Jergel, P. Siffalovic, K. Vegso et al. // Nanomaterials: Applications & Properties (NAP-2015) : Proceedings of the International Conference. — Sumy : Sumy State University, 2015. — V.4, No1. — 01NTF05.
Abstract	The paper presents the grazing-incidence small-angle X-ray scattering technique and its application to the studies of self-assembly and re-assembly effects of colloidal nanoparticles. Two basic cases are exemplified - solvent evaporation driven self-assembly and self-assembly driven by barrier movement in the Langmuir-Blodgett trough. Studies of the nanoparticle re-assembly effects due to the surfactant removal complete the overview. These examples document strength of GISAXS for an in situ tracking of processes at nanoscale. The results have direct implications for tailored preparation of the self -assembled nanoparticle templates for sensing, plasmonics and other applications.
Appears in Collections:	Наукові видання (ЕлІТ)