Raman Spectroscopic Measurement of a Vacuum-Deposited C60 Thin Film

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Title	Raman Spectroscopic Measurement of a Vacuum-Deposited C60 Thin Film
Authors	Konno, T. Ren, L. Piao, G. Juárez García, J.M. Suárez, F.M. Jimenez-Sandoval, S.J. Wakahara, T. Miyazawa, K. Ferreira, E.M.
ORCID
Keywords	C60 Fullerene Thin film Raman spectrometry Uncertainty
Type	Conference Papers
Date of Issue	2015
URI	http://essuir.sumdu.edu.ua/handle/123456789/42804
Publisher	Sumy State University
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Citation	Raman Spectroscopic Measurement of a Vacuum-Deposited C60 Thin Film [Текст] / K. Miyazawa, T. Konno, L. Ren et al. // Nanomaterials: Applications & Properties (NAP-2015) : Proceedings of the International Conference. — Sumy : Sumy State University, 2015. — V.4, No1. — 01MAN02.
Abstract	Measurement of Raman shifts of a C60 thin film and the evaluation of their uncertainties were conducted. A C60 thin film with a thickness of about 1.2 μm was fabricated on a SiO2 substrate by vacuum deposition. Raman spectra of the C60 thin film were obtained using the laser beam power density of 5.7 103 mW mm-2. The measured Raman shifts were corrected according to the calibration curve that was prepared using sulfur and naphthalene as the reference samples. Standard uncertainties were calculated and combined in order to determine the combined uncertainty and the expanded uncertainty. It was found that the increase of measurement time and measurement points for the calibration curve leads to the higher reliability.
Appears in Collections:	Наукові видання (ЕлІТ)