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Title | Structure and substructure properties of magnesium oxide thin films |
Authors |
Diachenko, Oleksii Viktorovych
Diachenko, Oleksii Viktorovych Opanasiuk, Anatolii Serhiiovych Kurbatov, Denys Ihorovych Панчал, Ч. Panchal, Ch. |
ORCID |
http://orcid.org/0000-0003-2312-5255 http://orcid.org/0000-0003-2312-5255 http://orcid.org/0000-0002-1888-3935 http://orcid.org/0000-0002-2754-6367 |
Keywords |
MgO спрей піроліз спрей пиролиз spray pyrolysis рентгеноструктурний аналіз рентгеноструктурный анализ x-ray diffraction analysis мікронапруга микронапряжение microstrain |
Type | Article |
Date of Issue | 2015 |
URI | http://essuir.sumdu.edu.ua/handle/123456789/43177 |
Publisher | Proceedings of International Symposium on Semiconductor Materials and Devices |
License | |
Citation | Structure and substructure properties of magnesium oxide thin films [Текст] / O.V. Diachenko, A.S. Opanasuyk, D.I. Kurbatov, Ch. Panchal // Proceedings of International Symposium on Semiconductor Materials and Devices. - 2015. - P.2-5. |
Abstract |
In this paper we have conducted a comprehensive study of the structural and substructural characteristics of magnesium oxide films by X-ray diffraction analysis. Thin films MgO were prepared by spray pyrolysis technique from a magnesium chloride solution. Identified the phase composition, the lattice constant, crystallite size and coherent scattering domain size, microstrain level of the films. The optimal conditions for the application of homogeneous single-phase films of stoichiometric composition were identified. |
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File | Size | Format | Downloads |
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Diachenko_Structure_properties_MgO.pdf | 558.48 kB | Adobe PDF | -55498870 |
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