AFM Calculated Parameters of Morphology Investigation of Spin Coated MZO (M = Al, Sn, Cd, Co) Layers

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Title	AFM Calculated Parameters of Morphology Investigation of Spin Coated MZO (M = Al, Sn, Cd, Co) Layers
Authors	Benhaliliba, M. Tiburcio-Silver, A. Avila-Garcia, A.
ORCID
Keywords	Spin coating ZnO layer Metallic dopant A tomic force microscope Grain size Roughness Histogram
Type	Article
Date of Issue	2015
URI	http://essuir.sumdu.edu.ua/handle/123456789/43200
Publisher	Sumy State University
License	Copyright not evaluated
Citation	Benhaliliba, M. AFM Calculated Parameters of Morphology Investigation of Spin Coated MZO (M = Al, Sn, Cd, Co) [Текст] / M. Benhaliliba, A. Tiburcio-Silver, A. Avila-Garcia // Журнал нано- та електронної фізики. — 2015. — Т.7, №4. — 04012-1.
Abstract	This paper reports on the deposition and surface properties of the pure and doped zinc oxide layers produced by spin coating route. Pure and metallic (Al, Sn, Cd, Co) doped ZnO films are characterized by mean of atomic force microscopy (AFM). Based on atomic force microscope observation, some parameters such as grain size, height, orientation of angle and histogram are determined. The AFM scanned 2D and 3D-views permit us to discover the roughness, the average height and the skewness of clusters or grains.
Appears in Collections:	Журнал нано- та електронної фізики (Journal of nano- and electronic physics)