Thickness-dependent Electrical and Piezoelectric Properties of Lead-Free Ferroelectric Ba[0.8]Sr[0.2]TiO[3] Thin Films

Kiselev, D.A.; Levashov, S.A.; Afanasieva, M.S.; Kiselev, A.M.; Chucheva, G.V.

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Title	Thickness-dependent Electrical and Piezoelectric Properties of Lead-Free Ferroelectric Ba[0.8]Sr[0.2]TiO[3] Thin Films
Authors	Kiselev, D.A. Levashov, S.A. Afanasieva, M.S. Kiselev, A.M. Chucheva, G.V.
ORCID
Keywords	lead-free ferroelectrics barium strontium titanate film polarization switching piezoelectric force microscopy
Type	Article
Date of Issue	2016
URI	http://essuir.sumdu.edu.ua/handle/123456789/47386
Publisher	Sumy State University
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Citation	Thickness-dependent Electrical and Piezoelectric Properties of Lead-Free Ferroelectric Ba[0.8]Sr[0.2]TiO[3] Thin Films [Текст] / D. A. Kiselev, S. A. Levashov, M. S. Afanasiev [et al.] // Журнал нано- та електронної фізики. - 2016. - Т.8, №3. - 03027
Abstract	The thickness dependent of electrical and piezoelectric properties of lead-free ferroelectric Ba[0.8]Sr[0.2]TiO[3] thin films is reported. Ba[0.8]Sr[0.2]TiO[3] (BST 80/20) thin films for various thickness, ranging from 150 nm to 550 nm, were prepared by high-frequency reactive sputtering of a ceramic target in an oxygen atmosphere on p-type Si substrate. Memory windows and effective dielectric constant of the BST film in Au/BST/Si thin film capacitors is found to increase with the increasing thickness of the film. Domain structure, domain switching and hysteresis loops of the BST 80/20 thin film were investigate via the piezoresponse force microscopy. Complete domain switching and strong piezoresponse are found in the ferroelectric BST film. The piezoelectric coefficient and the remnant piezoelectric response (ΔPR) of BST 80/20 films is found to increase with the thickness of the film
Appears in Collections:	Журнал нано- та електронної фізики (Journal of nano- and electronic physics)