Thickness Calculation of Thin Transparent Conductive Membrane on the Border with a Magnetic Fluid

Please use this identifier to cite or link to this item: http://essuir.sumdu.edu.ua/handle/123456789/49802

Or use following links to share this resource in social networks: Recommend this item

Title	Thickness Calculation of Thin Transparent Conductive Membrane on the Border with a Magnetic Fluid
Authors	Chekanov, V.V. Kandaurova, N.V. Chekanov, V.S.
ORCID
Keywords	Thin membrane Interference Electric field Magnetic fluid
Type	Article
Date of Issue	2016
URI	http://essuir.sumdu.edu.ua/handle/123456789/49802
Publisher	Sumy State University
License	Copyright not evaluated
Citation	V.V. Chekanov, N.V. Kandaurova, V.S. Chekanov, J. Nano- Electron. Phys. 8 No 4(1), 04045 (2016)
Abstract	The determination method of the membrane thickness of ITO (InSnO2). The magnetite nanoparticles in the electric field migrate, forming the thin layer near conductive ITO membrane with varying thickness. Lighting this structure by monochromatic plane polarized light the interference of light in the thin membrane was observed. The experimental values of the intensity of the reflected light from the surface of «ITO – layer of magnetite particles" for samples with different thickness of the conductive coating.
Appears in Collections:	Журнал нано- та електронної фізики (Journal of nano- and electronic physics)