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Title | Effect the Technique of Light Trapping on the Performance of Simple Junction n-p Solar Cells Based on GaAs and Si |
Authors |
Nour, S.
Belghachi, A. |
ORCID | |
Keywords |
Solar cell Si GaAs Light trapping |
Type | Article |
Date of Issue | 2017 |
URI | http://essuir.sumdu.edu.ua/handle/123456789/65706 |
Publisher | Sumy State University |
License | Copyright not evaluated |
Citation | Nour, S. Effect the Technique of Light Trapping on the Performance of Simple Junction n-p Solar Cells Based on GaAs and Si [Текст] / S. Nour, A. Belghachi // Журнал нано- та електронної фізики. – 2017. – Т.9, № 2. – 02005. – DOI: 10.21272/jnep.9(2).02005. |
Abstract |
Light trapping enhances the absorption of active materials in photovoltaic cells. The use of light trapping
results in a thinner active region in a solar cell, which lowers the production cost by reducing the
amount of material used, and increases the energy conversion efficiency by facilitating carrier collection
and enhancing the open circuit voltage. There are many light trapping techniques have been introduced in
order to enhance absorption of the active layer in the thin film solar cell. Antireflective layers reduce reflection
losses at interfaces, Light Trap: force the light to stay longer in the layer by changing the structure
of interfaces. In the present work we proposed a technique based on closed-form analytical calculation to
analyse the effect of light trapping on the performance of simple Si and GaAs np junction solar cells. Particular
importance is paid to light reflection. A comparison is carried out between three types of cells, with
antireflection coating, with texturing on the front of the cell, and with a lambertinne reflector. The conversion
efficiency increased from 23.00 % in a cell with GaAs texturing on the front and a rear reflector (incoherent
reflection) to 23.90 % and for Si it passes from 15.05 % to 16.00 %. GaAs solar cell exhibits a maximum
efficiency around 28.68 % with a Lambertian reflector. An efficiency of 19.37 % is obtained with Si
when a Lambertian reflector is inserted. |
Appears in Collections: |
Журнал нано- та електронної фізики (Journal of nano- and electronic physics) |
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File | Size | Format | Downloads |
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jnep_V9_02005_3.pdf | 346.28 kB | Adobe PDF | 83632657 |
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