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Title | Effect of Conductive Filament Temperature on ZrO2 based Resistive Random Access Memory Devices |
Authors |
Patil, Pramod J.
Ahir, Namita A. Yadav, Suhas Revadekar, Chetan C. Khot, Kishorkumar V. Kamat, Rajanish K. Dongale, Tukaram D. Kim, Deok-kee |
ORCID | |
Keywords |
simulation resistive memory thermal reaction model ZrO2 |
Type | Article |
Date of Issue | 2020 |
URI | https://essuir.sumdu.edu.ua/handle/123456789/77355 |
Publisher | Sumy State University |
License | |
Citation | Effect of Conductive Filament Temperature on ZrO2 based Resistive Random Access Memory Devices [Текст] / Pramod J. Patil, Namita A. Ahir, Suhas Yadav [et al.] // Журнал нано- та електронної фізики. – 2020. – Т. 12, № 2. – 02008. – DOI: 10.21272/jnep.12(2).02008. |
Abstract |
In the present work, the effect of reset voltage, filament radius, filament resistivity, and oxide membrane thickness on the nanoscale ZrO2 RRAM devices was reported. The present investigation is based on the thermal reaction model of RRAM. The outcomes show a decline in saturated temperature with a rise in the radius and resistivity of filament. Furthermore, increases in saturated temperature with an increase in oxide membrane thickness were observed for the ZrO2 based RRAM device. The saturated temperature of the device was mainly influenced by reset voltage, oxide layer thickness, filament size, and filament resistivity. The simulation results of the present investigation can be beneficial for the optimization of RRAM devices. |
Appears in Collections: |
Журнал нано- та електронної фізики (Journal of nano- and electronic physics) |
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China
-1283310199
Finland
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India
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File | Size | Format | Downloads |
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Pramod_J_Patil_JNEP_2_2020.pdf | 783.79 kB | Adobe PDF | 550169731 |
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