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Title Controlling the Transverse Magneto-Optical Kerr Effect in Cr/NiFe Bilayer Thin Films by Changing the Thicknesses of the Cr Layer
Authors Hashim, H.
Kozhaev, M.
Kapralov, P.
Panina, L.
Belotelov, V.
Vísova, I.
Chvostova, D.
Dejneka, A.
Shpetnyi, Ihor Oleksandrovych  
Latyshev, V.
Vorobiov, Serhii Ihorovych  
Komanicky, V.
ORCID http://orcid.org/0000-0002-6124-4696
http://orcid.org/0000-0002-5884-3292
Keywords transverse magneto-optical Kerr effect (TMOKE)
ferromagnetic coupling (FMC)
suppression or enhancement of magneto-optical properties
magnetic nanostructure multilayers
reflectivity
Type Article
Date of Issue 2020
URI https://essuir.sumdu.edu.ua/handle/123456789/82904
Publisher MDPI
License Creative Commons Attribution 4.0 International License
Citation Hashim, H.; Kozhaev, M.; Kapralov, P.; Panina, L.; Belotelov, V.; Víšová, I.; Chvostová, D.; Dejneka, A.; Shpetnyi, I.; Latyshev, V.; Vorobiov, S.; Komanický, V. Controlling the Transverse Magneto-Optical Kerr Effect in Cr/NiFe Bilayer Thin Films by Changing the Thicknesses of the Cr Layer. Nanomaterials 2020, 10, 256. https://doi.org/10.3390/nano10020256
Abstract Here, we demonstrate the impact of ferromagnetic layer coating on controlling the magneto-optical response. We found that the transverse magneto-optical Kerr effect (TMOKE) signal and TMOKE hysteresis loops of Ni80Fe20 thin layers coated with a Cr layer show a strong dependence on the thickness of the Cr layer and the incidence angle of the light. The transmission and reflection spectra were measured over a range of incidence angles and with different wavelengths so as to determine the layers’ optical parameters and to explain the TMOKE behavior. The generalized magneto-optical and ellipsometry (GMOE) model based on modified Abeles characteristic matrices was used to examine the agreement between the experimental and theoretical results. A comprehensive theoretical and experimental analysis reveals the possibility to create a TMOKE suppression/enhancement coating at specific controllable incidence angles. This has potential for applications in optical microscopy and sensors.
Appears in Collections: Наукові видання (ЕлІТ)

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