Electromigration Effects at Epitaxial Growth of Thin Films: Phase-Field Modeling

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Title	Electromigration Effects at Epitaxial Growth of Thin Films: Phase-Field Modeling
Authors	Dvornychenko, Alina Vasylivna
ORCID	http://orcid.org/0000-0003-4530-4262
Keywords	hase-field method epitaxial growth surface structures electromigration numerical simulation statistical characteristics
Type	Article
Date of Issue	2021
URI	https://essuir.sumdu.edu.ua/handle/123456789/84695
Publisher	Department of Physics and Astronomy of the National Academy of Sciences of Ukraine
License	Creative Commons Attribution 4.0 International License
Citation	Dvornichenko, A. (2021). Electromigration Effects at Epitaxial Growth of Thin Films: Phase-Field Modeling. Ukrainian Journal of Physics, 66(5), 439. https://doi.org/10.15407/ujpe66.5.439
Abstract	he epitaxial growth of thin films with regard for the anisotropy of the adsorbate surface dif-fusion induced by electromigration effects has been studied theoretically in the framework ofthe phase-field theory and with the use of numerical simulations. The influence of the coef-ficient of electromigration-induced anisotropic diffusion, which is proportional to the appliedelectric field strength, on the dynamics of growth of the film thickness and the height of sur-face structures, growing surface morphology, statistical characteristics of the surface multilayeradsorbate structures, and distribution of surface structures over their heights is revealed.
Appears in Collections:	Наукові видання (ЕлІТ)