Computer Simulation on the Behavior of the TCO/n-a-Si:H Interface Solar Cells

dc.contributor.authorDjaaffar, Rached
dc.contributor.authorHabib, Madani Yssaad
dc.contributor.authorWassila, Leila Rahal
dc.date.accessioned2019-01-22T14:13:52Z
dc.date.available2019-01-22T14:13:52Z
dc.date.issued2018
dc.description.abstractAmong the factors limiting the open circuit voltage of Heterojunctions with Intrinsic Thin layers solar cell, the surface potential barrier at the Indium Tin Oxide (ITO)/hydrogenated amorphous silicon (a-Si:H) interface is one of the most important. To reduce this surface potential barrier, we have varied the band bending by simulation. The aim is to understand why, in spite of a considerable change in the front contact barrier height at the interface ITO/n-а-Si:H (band banding reduced), the characteristics J(V) remain almost unchanged.ru_RU
dc.identifier.citationDjaaffar, Rached Computer Simulation on the Behavior of the TCO/n-a-Si:H Interface Solar Cells / R. Djaaffar, M.Y. Habib, L.R. Wassila // Журнал нано- та електронної фізики. - 2018. - Т.10, № 5. - 05012. - DOI: 10.21272/jnep.10(5).05012ru_RU
dc.identifier.urihttp://essuir.sumdu.edu.ua/handle/123456789/71478
dc.language.isoenru_RU
dc.publisherSumy State Universityru_RU
dc.rights.uricneen_US
dc.subjectHIT solar cellsru_RU
dc.subjectpotential barrierru_RU
dc.subjectband bendingru_RU
dc.subjectcurrent-voltage J(V) characteristicsru_RU
dc.subjectamorphous siliconru_RU
dc.titleComputer Simulation on the Behavior of the TCO/n-a-Si:H Interface Solar Cellsru_RU
dc.typeArticleru_RU

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