Structural features of ZnOxS1- nanostructured films
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Date
2014
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IEEE Publishing
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Abstract
В работе методом химического осаждения из растворов ацетата цинка, тиамочевины и аммиака получены наноструктурированные слои твердых растворов ZnOxS1-x. Структурные особенности пленок ZnOxS1-x исследованы методами растровой микроскопии и рентгеновской дифрактометрии. В результате установлено влияние времени осаждения на элементный и фазовый состав тонких слоев, а также их структурные характеристики, такие как период решетки и качество текстуры.
In this paper, ZnOxS1-x nanostructured flayers were obtained by chemical bath deposition from solutions of zinc acetate, ammonia and thiourea. Structural features of ZnOxS1-x films were studied by scanning electron microscopy and X-ray diffraction. It is found the effect of condensation time on the elemental and phase composition of the thin layers, as well as their structural characteristics, such as lattice constants and growth texture.
In this paper, ZnOxS1-x nanostructured flayers were obtained by chemical bath deposition from solutions of zinc acetate, ammonia and thiourea. Structural features of ZnOxS1-x films were studied by scanning electron microscopy and X-ray diffraction. It is found the effect of condensation time on the elemental and phase composition of the thin layers, as well as their structural characteristics, such as lattice constants and growth texture.
Keywords
структурні особливості, структурные особенности, structural features, наноструктури, наноструктуры, nanostructure, ZnOxS1-x
Citation
Berestok, T.O. Structural features of ZnOxS1- nanostructured films [Text] / T.O. Berestok, A.S. Opanasyuk, N.M. Opanasyuk // 23nd International Crimean Conference «Microwave & Telecommunication Technology», (СriMiCo-2014), Sevastopol', 7-13 September. - Sevastopol, 2014. - P. 777-778.
