Positron Trapping Processes in Temperature-Sensitive Thick- film Structures

Abstract

Positron trapping processes in so-called “free” thick-film structures based on spinel-type Cu0.1Ni0.8Co0.2Mn1.9O4 ceramics are studied. The observed positron trapping can be fully defined within the two-state positron trapping model. The defect-related component in the fit of the experimentally measured positron lifetime spectra for thick films and bulk ceramics testifies to similarity of positron trapping processes in spinel-based materials. It is shown that in some cases the size of free-volume entities in thick films can rise due to redistribute space of their inner structure at addition glasses and other compounds. But positrons are trapped more strongly in bulk ceramics due to more ramified their grain/pores structure.