Знаменщиков, Ярослав ВолодимировичЗнаменщиков, Ярослав ВладимировичZnamenshchykov, Yaroslav VolodymyrovychКосяк, Володимир ВолодимировичКосяк, Владимир ВладимировичKosiak, Volodymyr VolodymyrovychОпанасюк, Анатолій СергійовичОпанасюк, Анатолий СергеевичOpanasiuk, Anatolii SerhiiovychFochuk, P.M.2015-11-182015-11-182015Effect of Laser Annealing on the Properties of the Surface of Polycrystalline CdZnTe Thick Film [Текст] / Ya.V. Znamenshchykov, V.V. Kosyak, A.S. Opanasyuk, P.M. Fochuk // Nanomaterials: Applications & Properties (NAP-2015) : Proceedings of the International Conference. — Sumy : Sumy State University, 2015. — V.4, No1. — 01NTF16.0000-0002-1888-39350000-0002-6866-0414http://essuir.sumdu.edu.ua/handle/123456789/42798In this work effect of laser annealing on properties of surface of CdxZn1-xTe (CZT) films was studied. CZT layers were deposited by co-evaporation of CdTe and ZnTe using close-spaced vacuum sublimation (CSVS) method. Structural properties and chemical composition of films were studied by X-ray Diffraction (XRD) and Energy Dispersive Spectroscopy (EDS). The annealing of the sample was carried out with the help of micro-Raman infrared laser of 785 nm wavelength at maximal 100x magnification. It was established that laser annealing of the surface substantially causes redistribution of Zn atoms. More detailed study of the sample by the scanning of surface with the micro-Raman method allows to determine trend in this process and to detect Te-rich zones. Improvement of the crystal quality near annealed area of the thick film was achieved.encneCdZnTethick filmslaser annealingRamansemiconductorX-ray detectorsTheses