Chornous, Anatolii MykolaiovychDehtiaruk, Leonid VasylovychMarszalek, M.Protsenko, Ivan YukhymovychЧорноус, Анатолій МиколайовичЧорноус, Анатолий НиколаевичДехтярук, Леонід ВасильовичДехтярук, Леонид ВасильевичПроценко, Іван ЮхимовичПроценко, Иван Ефимович2010-12-202010-12-202006Conductivity and temperature coefficient of resistance of multilayered polycrystalline films [Text] / A.M. Chornous, L.V. Dekhtyaruk, M. Marszalek, I.Y. Protsenko // Cryst. Res. Technol. 41, №. 4, 388-399 (2006).0000-0003-3351-93030000-0002-5009-5445http://essuir.sumdu.edu.ua/handle/123456789/707We calculate the electric conductivity and the temperature coefficient of resistance (TCR) of a multilayered film consisting of the alternating polycrystalline metal layers of different thickness and purity within the relaxation time formalism. In the case of Cr, Cu and Co-based multilayered films we perform verification of our analytical formulas and demonstrate a qualitative agreement between the theoretically calculated values of the TCR and experiment. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/707encnemultilayered filmstemperature coefficient of resistanceмногослойные плёнкитемпературный коэффициент сопротивлениябагатошарові плівкитемпературний коефіцієнт опоруConductivity and temperature coefficient of resistance of multilayered polycrystalline filmsArticle