Погребняк, Олександр ДмитровичПогребняк, Александр ДмитриевичPohrebniak, Oleksandr DmytrovychОпанасюк, Анатолій СергійовичОпанасюк, Анатолий СергеевичOpanasiuk, Anatolii SerhiiovychКурбатов, Денис ІгоровичКурбатов, Денис ИгоревичKurbatov, Denys IhorovychKolotova, I.A.Amekura, H.Климов, Олексій ВолодимировичКлимов, Алексей ВладимировичKlymov, Oleksii VolodymyrovychTakeda, Y.Kozak, C.Шипиленко, Андрій ПавловичШипиленко, Андрей ПавловичShypylenko, Andrii Pavlovych2014-02-032014-02-032013Effect of Cu negative ion implantation on physical properties of Zn1-xMnxTe films [Text] / A.D. Pogrebnjak, A.P. Shypylenko, H. Amekura, Y. Takeda, A.S. Opanasyuk, D.I. Kurbatov, I.A. Kolotova, O.V. Klymov, C. Kozak // Acta Physica Polonica A. –2013. – Vol. 123;№ 5. - P. 939-942.0000-0002-1741-25250000-0002-9218-64920000-0002-1888-39350000-0002-2754-6367http://essuir.sumdu.edu.ua/handle/123456789/33849The paper deals with the investigations of structural properties of Zn1-xMnxTe lms, which were fabricated under various deposition conditions using the thermal evaporation method in a closed volume. The surface mor- phology of the samples was studied, the phase analysis of their structures was performed, the elemental analysis of the lms and the crystal lattice constant were investigated. The texture perfection of the lms before and after copper ion implantation was evaluated. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33849encneIon ImplantationZn1-xMnxTe Filmssurface morphologyphase analysiselemental analysisArticle