Vozny, A.A.Stetsenko, Μ.Ο.Rudenko, S.P.Косяк, Володимир ВолодимировичКосяк, Владимир ВладимировичKosiak, Volodymyr VolodymyrovychMaksimenko, L.S.Опанасюк, Анатолій СергійовичОпанасюк, Анатолий СергеевичOpanasiuk, Anatolii SerhiiovychSerdega, B.K.2015-11-042015-11-042015Detection of Structural Characteristics of Nanosized SnxSy Film by the Modulation-polarization Spectroscopy of Plasmon Resonance [Текст] / A.A. Vozny, M.O. Stetsenko, S.P. Rudenko et al. // Nanomaterials: Applications & Properties (NAP-2015) : Proceedings of the International Conference. — Sumy : Sumy State University, 2015. — V.4, No2. — 02NAESP06.0000-0002-1888-3935http://essuir.sumdu.edu.ua/handle/123456789/42581The present work deals with the study of the structural properties of nanosized SnS2 films deposited by the close-spaced vacuum sublimation (CSVS) method. Surface morphology of the obtained films was determined by the scanning electron microscope (SEM-102Е). Structural investigations of the films were performed with the Raman spectroscopy. The analysis of chemical composition of the layers was carried out by the scanning electron microscope by energy dispersive X-ray (ЕDS) spectroscopy. The structure features of SnxSy films were investigated by the modulation-polarization spectroscopy (MPS) technique of surface plasmon resonance.encneThin filmsSnxSyCo-evaporationSurface morphologyX-ray diffractionSurface plasmonModulation-polarization spectroscopyTheses