Опанасюк, Анатолій СергійовичОпанасюк, Анатолий СергеевичOpanasiuk, Anatolii SerhiiovychІващенко, Максим МиколайовичИващенко, Максим НиколаевичIvashchenko, Maksym MykolaiovychКлимов, Олексій ВолодимировичКлимов, Алексей ВладимировичKlymov, Oleksii VolodymyrovychКурбатов, Денис ІгоровичКурбатов, Денис ИгоревичKurbatov, Denys IhorovychКолесник, Максим МиколайовичКолесник, Максим НиколаевичKolesnyk, Maksym MykolaiovychCheong, H.Nam, D.2014-05-272014-05-272012Raman Investigation on ZnS, ZnSe, ZnTe Thin Films Obtained by CSVS Technique / H. Cheong, D. Nam, A. S. Opanasyuk et al. // Nanomaterials: Applications & Properties (NAP-2012) : 2-nd International conference, Alushta, the Crimea, September 17-22, 2012 / Edited by: A. Pogrebnjak. - Sumy : Sumy State University, 2012. - V.1, No3. - 03TF210000-0003-2019-83870000-0002-1888-39350000-0002-4611-09560000-0002-2754-6367http://essuir.sumdu.edu.ua/handle/123456789/35100In this work, Raman spectra of zinc sulfide, zinc selenide, and zinc telluride thin film semiconductors deposited by the close-spaced vacuum sublimation technique were investigated. All of the films showed longitudinal optical phonon mode replicas. Varying the substrate temperature results in small shifts of the phonon frequencies in ZnSe and ZnTe, but not in ZnS thin films. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35100encneZinc sulfideZinc selenideZinc tellurideFilmsReplicaPhononRaman spectroscopyTheses